The elemental composition of electrodeposited NiFe thin films was analyzed with particle-induced X-ray emission (PIXE). The thin films were electrodeposited on polycrystalline Au substrates from a 100mM NiSO4, 10 mM FeSO4, 0.5M H3BO3, and 1M Na2SO4 solution. PIXE spectra of these films were analyzed to obtain relative amounts of Ni and Fe as a function of deposition potential and deposition time. The results show that PIXE can measure the total deposited metal in a sample over at least four orders of magnitude with similar fractional uncertainties. The technique is also sensitive enough to observe the variations in alloy composition due to sample nonuniformity or variations in deposition parameters.
Repository citation: Frey, Alyssa; Wozniak, Nicholas; Nagi, Timothy; Keller, Matthew; Lunderberg, J. Mark; Peaslee, Graham F.; DeYoung, Paul; and Hampton, Jennifer R., "Analysis of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission" (2011). Faculty Publications. Paper 280.
Published in: International Journal of Electrochemistry, Volume 2011, January 1, 2011, pages 604395-. Copyright © 2011 SAGE-Hindawi. The final published version is available at: http://dx.doi.org/10.4061/2011/604395