Forensic analysis of tempered sheet glass by particle induced X-ray emission (PIXE)
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms
Elsevier Science BV
The elemental concentrations of five trace elements in tempered sheet glass fragments were determined using particle-induced X-ray emission (PIXE) spectrometry. The trace element concentrations for calcium, iron, manganese, strontium, and titanium are compared to those obtained by inductively-coupled plasma-atomic emission spectrometry (ICP-AES) following complete digestion by hydrofluoric acid. For these five elements, the absolute concentrations obtained by both methods are shown to agree well over a wide range of concentrations. The limits of detection for trace elements are typically lower for the ICP-AES method. However, we show that the concentrations of these five elements can be accurately measured by the PIXE method. Since PIXE is an entirely non-destructive method, there exists a niche for this technique to be used as a complement to the more sensitive ICP-AES technique in the forensic analysis of sheet glass.
Ion beam analysis, PIXE, Glass, ICP-AES, Nondestructive, Forensic trace element analysis
Published in: Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, Volume 269, Issue 10, May 15, 2011, pages 1067-1070. Copyright © 2011 Elsevier Science BV, Amsterdam, Netherlands. The final published version is available at: http://dx.doi.org/10.1016/j.nimb.2011.02.079