Faculty Mentor(s)
Andrew Bunnell, Physics; Dr. Reena Philip, Union Christian College, Aluva, India
Document Type
Poster
Event Date
4-12-2024
Abstract
Material characterization is an important step in the experimental processes. This step ensures that the samples' processing yields the intended results. This work outlines the process taken to analyze and characterize a set of industrial thin films. Our characterization starts with an elemental baseline from scanning electron microscopy (SEM). The composition is verified by SimNRA (Simulation Nuclear Reaction Analysis) calculations fitting Rutherford Backscattering (RBS) data collected from a silicon surface barrier (particle) detector.
Recommended Citation
Repository citation: Jobson, Nathaniel; Walther, Jacob; Rink, Justin; and Pinkerton, Wil, "Material Characterization for Industrial Processes of Thin Titanium Nanotube Films" (2024). 23rd Annual A. Paul and Carol C. Schaap Celebration of Undergraduate Research and Creative Activity (2024). Paper 43.
https://digitalcommons.hope.edu/curca_23/43
April 12, 2024. Copyright © 2024 Hope College, Holland, Michigan.
