Characterization of a Magnetic Coil and Magnetic Force Microscopy of NiFe Thin Films

Student Author(s)

John Baranski

Faculty Mentor(s)

Dr. Jennifer Hampton

Document Type


Event Date



Magnetic thin films are widely used in the storage and reading of computer data. Electrochemical deposition is an effective way of creating these films. The purpose of this project is to electrodeposit permalloy (NiFe) films on gold-plated silicon wafers and characterize them through multiple analytical techniques. The structure and composition of these deposits were characterized with Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS). The magnetic domains of the films were then analyzed using Magnetic Force Microscopy (MFM). Preliminary results suggest that the size of magnetic domains of the depositions decreases over time. A magnetic coil was also characterized so that it can be used in the future for MFM imaging in applied magnetic field. The coil was able to produce a magnetic field of 0.00352T±0.00007T at a distance of 1cm away when driven with a constant current of 0.3A.

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