Document Type

Article

Publication Date

10-21-2014

Comments

© 2014 AIP Publishing LLC Appl. Phys. Lett. 105, 163504 (2014); http://dx.doi.org/10.1063/1.4899130

Abstract

We report on experimental studies of phonon sensors which utilize quasiparticle diusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al lms in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al lms using a simple diusion equation approach. These studies allow the design of phonon sensors with improved performance.

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